BIBFRAME Work

Title

Variation-Aware Advanced CMOS Devices and SRAM

Type

  • Text
  • Monograph

Contribution

Subject

Language

Classification

  • ClassificationDdc: 621.3815
  • ClassificationLcc: TK7867-7867.5

Content

Summary

This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications of novel CMOS devices to cache memory (or Static Random Access Memory, SRAM). The author places emphasis on the physical understanding of process-induced random variation as well as the introduction of novel CMOS device structures and their application to SRAM. The book outlines the technical predicament facing state-of-the-art CMOS technology development, due to the effect of ever-increasing process-induced random/intrinsic variation in transistor performance at the sub-30-nm technology nodes. Therefore, the physical understanding of process-induced random/intrinsic variations and the technical solutions to address these issues plays a key role in new CMOS technology development. This book aims to provide the reader with a deep understanding of the major random variation sources, and the characterization of each random variation source. Furthermore, the book presents various CMOS device designs to surmount the random variation in future CMOS technology, emphasizing the applications to SRAM.

Table of Contents

1 Introduction and Overview -- 2 Understanding of Process-Induced Random Variation -- 3 Various Variation-Robust CMOS Device Designs -- 4 Applications to Static Random Access Memory (SRAM) -- 5 Conclusion.

Authorized Access Point

Shin, Changhwan. Variation-Aware Advanced CMOS Devices and SRAM

Admin Metadata

  • Date: 2026-07-07T22:44:41.093650+00:00
  • Agent: bcld
  • Status: c
  • Derived from: 21682937

Admin Metadata

  • Date: 2026-07-07
  • Cataloger id: Unknown
  • Description level: bibframe-2-6-0
  • Description language: eng
  • Description authentication: pcc

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